基于51单片机集成芯片测试仪设计（包含原理图源程序）

[{"title":"（36个子文件767KB）基于51单片机集成芯片测试仪设计（包含原理图源程序）","children":[{"title":"集成芯片测试仪","children":[{"title":"原理图及PCB","children":[{"title":"yuanjian.SchLib <span style='color:#111;'>16.00KB</span>","children":null,"spread":false},{"title":"Chiptester.SchDoc <span style='color:#111;'>146.50KB</span>","children":null,"spread":false},{"title":"Chiptester.PcbLib <span style='color:#111;'>54.00KB</span>","children":null,"spread":false},{"title":"Chiptester.PrjPcb <span style='color:#111;'>46.92KB</span>","children":null,"spread":false},{"title":"Chiptester.PcbDoc <span style='color:#111;'>996.50KB</span>","children":null,"spread":false},{"title":"__Previews","children":[{"title":"Chiptester.SchDocPreview <span style='color:#111;'>79.01KB</span>","children":null,"spread":false},{"title":"Chiptester.PcbDocPreview <span style='color:#111;'>41.49KB</span>","children":null,"spread":false}],"spread":true}],"spread":true},{"title":"~$测量实验报告.docx <span style='color:#111;'>162B</span>","children":null,"spread":false},{"title":"源程序","children":[{"title":"LCD12864","children":[{"title":"LCD12864.c <span style='color:#111;'>3.80KB</span>","children":null,"spread":false},{"title":"LCD12864.h <span style='color:#111;'>1.02KB</span>","children":null,"spread":false}],"spread":true},{"title":"Keys","children":[{"title":"keys.h <span style='color:#111;'>252B</span>","children":null,"spread":false},{"title":"keys.c <span style='color:#111;'>1.30KB</span>","children":null,"spread":false}],"spread":true},{"title":"User","children":[{"title":"121.c <span style='color:#111;'>18.12KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪_uvproj.bak <span style='color:#111;'>13.84KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.uvproj <span style='color:#111;'>13.69KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪_uvopt.bak <span style='color:#111;'>6.20KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.uvgui.ZJ <span style='color:#111;'>70.66KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.uvgui.liangzhao <span style='color:#111;'>137.21KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.uvopt <span style='color:#111;'>6.54KB</span>","children":null,"spread":false},{"title":"123.c <span style='color:#111;'>18.10KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.uvgui_ZJ.bak <span style='color:#111;'>70.66KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.uvgui_liangzhao.bak <span style='color:#111;'>138.12KB</span>","children":null,"spread":false},{"title":"main.c <span style='color:#111;'>7.85KB</span>","children":null,"spread":false}],"spread":false},{"title":"Obj","children":[{"title":"main.lst <span style='color:#111;'>15.39KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.hex <span style='color:#111;'>7.78KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.lnp <span style='color:#111;'>147B</span>","children":null,"spread":false},{"title":"LCD12864.lst <span style='color:#111;'>7.86KB</span>","children":null,"spread":false},{"title":"keys.obj <span style='color:#111;'>2.28KB</span>","children":null,"spread":false},{"title":"main.obj <span style='color:#111;'>15.31KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.build_log.htm <span style='color:#111;'>220B</span>","children":null,"spread":false},{"title":"keys.lst <span style='color:#111;'>3.10KB</span>","children":null,"spread":false},{"title":"LCD12864.obj <span style='color:#111;'>12.72KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪 <span style='color:#111;'>24.99KB</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.plg <span style='color:#111;'>204B</span>","children":null,"spread":false},{"title":"74系列芯片检测仪.m51 <span style='color:#111;'>26.78KB</span>","children":null,"spread":false}],"spread":false},{"title":"Port","children":[{"title":"port.h <span style='color:#111;'>116B</span>","children":null,"spread":false}],"spread":true}],"spread":true}],"spread":true}],"spread":true}]